Observation equipment - 企業ランキング(全7社)

更新日: 集計期間:Feb 18, 2026〜Mar 17, 2026
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会社名 代表製品
製品画像・製品名・価格帯 概要 用途/実績例
For more details, please refer to the PDF document or feel free to contact us. For more details, please refer to the PDF document or feel free to contact us.
For more details, please refer to the PDF document or feel free to contact us. For more details, please refer to the PDF document or feel free to contact us.
For more details, please refer to the PDF document or feel free to contact us. For more details, please refer to the PDF document or feel free to contact us.
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  1. 代表製品
    MLCC crack X-ray observationMLCC crack X-ray observation
    概要
    For more details, please refer to the PDF document or feel free to contact us.
    用途/実績例
    For more details, please refer to the PDF document or feel free to contact us.
    Observation of conductive particle shape in COG implementationObservation of conductive particle shape in COG implementation
    概要
    For more details, please refer to the PDF document or feel free to contact us.
    用途/実績例
    For more details, please refer to the PDF document or feel free to contact us.
    Observation of diffusion layers in semiconductors using FIB-SEM.Observation of diffusion layers in semiconductors using FIB-SEM.
    概要
    For more details, please refer to the PDF document or feel free to contact us.
    用途/実績例
    For more details, please refer to the PDF document or feel free to contact us.